Spatial resolution limits for synchrotron-based spectromicroscopy in the mid- and near-infrared
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چکیده
منابع مشابه
Spatial resolution limits for synchrotron-based spectromicroscopy in the mid- and near-infrared.
Spatial resolution tests were performed on beamline 1.4.4 at the Advanced Light Source in Berkeley, CA, USA, a third-generation synchrotron light source. This beamline couples the high-brightness synchrotron source to a Thermo-Electron Continumicrom XL infrared microscope. Two types of resolution tests were performed in both the mid-IR and near-IR. The results are compared with a diffraction-li...
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Detailed spatial resolution tests were performed on beamline 1.4.4 at the Advanced Light Source synchrotron facility in Berkeley, CA. The high-brightness synchrotron source is coupled at this beamline to a Thermo-Electron ContinulmXL infrared microscope. Two types of resolution tests in both the mid-IR (using a KBr beamsplitter and an MCT-A* detector) and in the near-IR (using a CaF2 beamsplitt...
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ژورنال
عنوان ژورنال: Journal of Synchrotron Radiation
سال: 2008
ISSN: 0909-0495
DOI: 10.1107/s0909049508004524